Features
The Total Absolute Measurement System (TAMS) is an industry leading automated goniometer type accessory for variable angle optical measurements, to expand the capabilities of the LAMBDA® 850+/1050+ instruments.
Plug and play: neatly fits into detector compartment of LAMBDA UV-Vis-NIR spectrophotometers to install in minutes
High angular accuracy and photometric sensitivity for repeatable, defensible absolute measurement data
Intuitive software control and straightforward operation for any user
Conservation of sample beam polarisation: separate measurements with S and P for every angle
Modular detector design for unmatched capability to handle any sample: multiple detector options depending on your application.
Applications
Tailor your TAMS
The TAMS unit features five detector units which are easily swapped to adapt to any sampling challenge.
Select a direct or sphere detector:
- Sphere detectors maximise accuracy. Ideally suited for thin films[FA4.1], slightly curved samples and prisms. Measure directional reflectance and transmittance
- Direct detectors maximise sensitivity. Characterise patterned surfaces and diffuse coatings. Evaluate angular resolved scattering including BRDF/BTF.
Features
0.01° resolution. 0.02° accuracy. Fully automated.
Measure challenging samples with angular dependencies with confidence. The sample and detector rotate independently using a precise goniometer design, giving you angular resolved absolute reflectance/transmittance data from 5° to 80°. From 6-inch wafers to 150 × 150 mm samples, every angle lands exactly where you set it.
Complex angle-resolved measurements with minimal set-up.
TAMS removes the need for manual angle changes, repeated repositioning and hours at the bench. With TAMS, you define the measurement and the system does the rest, with fully automated sample and detector positioning. Combine with the autosampler, which runs from the same TAMS interface, to increase throughput. Less setup, fewer operator errors, and more of your day spent on results.
Measure from positive and negative angles of incidence
The TAMS facilitates reflectance measurements from both positive and negative angles of incidence, accounting for more angle-dependent behaviour at higher AOI, and characterise asymmetric or imperfect materials.
One instrument, any measurement
TAMS is one of the swappable accessories on the LAMBDA 850+/1050+ platform, alongside integrating spheres, detector modules and the General Purpose Optical Bench, and it changes over in minutes. It occupies only the detector compartment, and operators can exchange the detectors for modules optimized for each application, from sphere sets for maximum accuracy to standard sets for maximum sensitivity. With an upgradeable detector configuration and an autosampler that handles wafers and multi-sample holders, one system adapts to your next material, not just your current one.
Expand your TAMS unit
The TAMS have a variety of accessories to expand the capabilities and measure additional sample types
TAMS Small Sample Holder
Measure small round samples up to 1.5 inch
Learn More
TAMS Wafer Sample Holder for 200mm Wafers
Measure wafers of 200 mm
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TAMS High Resolution Aperture set
Control spot size on the sample and acceptance angle of the detector
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TAMS Autosampler
Automate the measurement of up to 19 samples
Learn MoreThere are 5 detector configurations for the TAMS unit:
| Part Number | Model Name | Wavelength Range |
|---|---|---|
| L6310242 | Si/InGaAs Sphere Detector Set | 200 – 2600 nm |
| L6310244 | Enhanced Si Sphere Detector Set | 190 – 1150 nm |
| L6310255 | Enhanced Si/InGaAs Sphere Detector Set | 200 – 2500 nm |
| L6310247 | Enhanced Si Detector Set | 190 – 1150 nm |
| L6310254 | Enhanced Si/InGaAs Detector Set | 200 – 2600 nm |
FAQ
Resources
TAMS Integrating Sphere Detectors Performance Evaluation
TAMS Integrating Sphere Detectors Performance Evaluation
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