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The advanced material applications of today, particularly those utilized in growing high technology industries like semiconductor, optoelectronic devices, solar, aerospace, and defense, demand innovations for high performance detection and analysis of solid state materials. This video workshop features PerkinElmer Senior Field Application Scientists John Birtles, Ph.D. and Chris Lynch whom will focus on UV-Vis-NIR technology and various modular sampling accessories and detector modules which are used to address a broad range of material types, all within a single instrument.
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