Semiautomated Silicon Wafer Characterization on the Spectrum 3 MIR/NIR/FIR Spectrometer


In this webcast, Ian Robertson, PerkinElmer application scientist discusses the versatility of FTIR technology to solve semiconductor analysis challenges such as ID of raw materials, materials characterization, chemical supply chain QA/QC, final product analyses, and silicon wafer characterization with the Spectrum 3 MappIR solution.