Impurities Management in REE and Other Metallic Concentrates


In this webinar, the importance of accurate trace-element analysis in rare earth elements (REEs) and high purity metals as well as challenges in measuring trace elements by ICP-MS are discussed. Interference removal tactics offered by the NexION® 5000 multi-quadrupole ICP-MS are examined and several examples demonstrate the power of this unique tandem four-quad solution.