PerkinElmer
Brief PMS299 D

Application Note

Analysis of Single-Walled Carbon Nanotubes with SP-ICP-MS

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Introduction

Measuring the amount of metals in CNTs presents a challenge. High levels can be measured directly in the solid by several techniques, including XRF and TEM, while low-level analysis requires complete digestion of the sample prior to analysis by ICP-OES or ICP-MS.