Introduction
Axial and radial plasma viewing each offer unique advantages—but neither alone addresses the full range of ICP-OES analytical challenges. The Dual View capability of the Avio® 3000 ICP-OES combines the strengths of both, expanding the instrument’s linear dynamic range and enabling both plasma views within a single method. Axial view enhances sensitivity for trace-level elements, while radial view delivers the robustness needed for high-concentration measurements. If interferences arise in axial view, analysis can be seamlessly shifted to radial view or to an alternate emission line, ensuring accurate, reliable results across diverse sample types.
Download this technical note to learn more about the benefits of the Avio 3000 ICP-OES system’s vertical dual view design.
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