PerkinElmer
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MappIR Accessory for 8” Wafers

 

Semiconductor wafer design and manufacturing requires maintenance of efficient and high-quality production processes that ultimately meet customer specifications and demands. Fabrication and QA/QC managers are often challenged with unreliable testing that results in production interruptions, lack of confidence in testing, or complex equipment requiring extensive training.

MappIR accessory with Spectrum 3 FT-IR system helps ensure quality, reduce fail rates, drive out impurities and deliver production results. Whether improving the final product uniformity and reducing glass-forming temperatures in front-end fabrication or evaluating and verifying doping levels to maintain and optimize production processes, MappIR delivers high-quality results you can trust in an easy-to-use interface that requires minimal training.

Part Number
Width
L1270109
8.0 in
more
L1270110
12.0 in
more
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Overview

The PerkinElmer Spectrum™ 3 FT-IR spectrometer provides the sampling flexibility and performance in mid, near, and far infrared ranges through a single instrument to advance research and new product development. The highly configurable platform provides dependable, consistent, and trouble-free operation through years of service.

The MappIR accessory together with the Spectrum 3 FT-IR helps advance and accelerate your semiconductor design in the following areas:

Front-End Fabrication

  • Material identification
  • Curing verification
  • Testing to assess defects in chips
  • Contaminant or particle detection

Back-End Assembly

  • Final silicon wafer QA/QC testing
  • Defect analysis

Specifications

Product Brand Name MappIR
Technology Type FT-IR
Width 8.0 in
Resources, Events & More
  • All

Application Note

Semi-Automated FT-IR Measurements of Elemental Impurities in Silicon Wafers

Silicon wafer production is expected to grow in the coming years with increased demand for semiconductors especially in consumer electronics, automotives, and the use of silicon devices in the growing solar power industry. The Czochralski (CZ) process most widely adopted process in the industry f ...

PDF 1 MB

Brochure

MappIR Mini Brochure

From fabrication to assembly, wafer design and manufacturing comes with many challenges. The Spectrum 3 MappIR FT-IR helps ensure quality, reduce fail rates, drive out impurities, and improve wafer production processes to accelerate product innovation and meet customer demands.< ...

PDF 2 MB
Spectrum 3 FT-IR Interactive Brochure

The PerkinElmer Spectrum 3 FT-IR spectrometer provides the sampling flexibility and analytical performance in mid, near, and far infrared ranges through a single instrument to advance research and new product development in academia, chemicals, polymers, and pharmaceuticals. Read the interactive ...

PDF 2 MB