PerkinElmer
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MappIR Accessory for 12” Wafers

 

Semiconductor wafer design and manufacturing requires maintenance of efficient and high-quality production processes that ultimately meet customer specifications and demands. Fabrication and QA/QC managers are often challenged with unreliable testing that results in production interruptions, lack of confidence in testing, or complex equipment requiring extensive training.

MappIR accessory with Spectrum 3 FT-IR system helps ensure quality, reduce fail rates, drive out impurities and deliver production results. Whether improving the final product uniformity and reducing glass-forming temperatures in front-end fabrication or evaluating and verifying doping levels to maintain and optimize production processes, MappIR delivers high-quality results you can trust in an easy-to-use interface that requires minimal training.

Part Number
Width
L1270109
8.0 in
more
L1270110
12.0 in
more
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Overview

The PerkinElmer Spectrum™ 3 FT-IR spectrometer provides the sampling flexibility and performance in mid, near, and far infrared ranges through a single instrument to advance research and new product development. The highly configurable platform provides dependable, consistent, and trouble-free operation through years of service.

The MappIR accessory together with the Spectrum 3 FT-IR helps advance and accelerate your semiconductor design in the following areas:

Front-End Fabrication

  • Material identification
  • Curing verification
  • Testing to assess defects in chips
  • Contaminant or particle detection

Back-End Assembly

  • Final silicon wafer QA/QC testing
  • Defect analysis

Specifications

Product Brand Name MappIR
Technology Type FT-IR
Width 12.0 in