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NexION 350S ICP-MS Spectrometer

The NexION® 350S ICP-MS features a dual-channel Universal Cell that has been optimized for sensitivity. The system uses pure reactive gases to remove any and all interferences with little or no loss of analyte sensitivity, ideal for applications demanding the very best performance and an unprecedented level of interference removal.

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NexION350S

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Overview

The NexION® 350S ICP-MS features a dual-channel Universal Cell that has been optimized for sensitivity. The system uses pure reactive gases to remove any and all interferences with little or no loss of analyte sensitivity, ideal for applications demanding the very best performance and an unprecedented level of interference removal. The NexION 350S ICP-MS configuration was designed specifically for the semiconductor industry.

Specifications

21 CFR Part 11 Compatible Yes
Height 76.0 cm
Mode Standard, Collision, Reaction
Model Name NexION 350S
Portable No
Product Brand Name NexION
Warranty 1 Year
Weight 181.0 kg
Width 122.5 cm

Resources, Events & More

All (15)
Resource Type File Name File Format
Product Note All Matrix Solution (AMS) Systems for the NexION ICP-MS PDF 535 KB
Guide NexION ICP-MS Consumables and Supplies Reference Guide PDF 1 MB
White Paper An Introduction and Overview of FAST-FIAS Coupled to the NexION ICP-MS PDF 1 MB
White Paper Weighing the Benefits and Risks of Nanotechnology White Paper PDF 1 MB
Application Note Analysis of Iron Nanoparticles in Organic Solvents Used in the Semiconductor Industry Using SP-ICP-MS in Reaction Mode PDF 1 MB
Application Note Analysis of Plant Materials for Toxic and Nutritional Elements with the NexION 350 ICP-MS PDF 1 MB
Application Note Assessing the Fate of Nanoparticles in Biological Fluids using SP-ICP-MS PDF 1 MB
Application Note Determination of Impurities in Electronic-Grade Hydrochloric Acid with the NexION 350S ICP-MS PDF 2 MB
Application Note Determination of Impurities in Organic Solvents used in the Semiconductor Industry with the NexION 350S ICP-MS PDF 2 MB
Application Note Determination of Impurities in Semiconductor-Grade Nitric Acid with the NexION 350S ICP-MS PDF 2 MB
Application Note Determination of Impurities in Semiconductor-Grade Sulfuric Acid with the NexION 350S ICP-MS PDF 1 MB
Application Note Determination of Impurities in Semiconductor-Grade TMAH with the NexION 350S ICP-MS PDF 1 MB
Application Note Determination of Impurities in Silica Wafers with the NexION 350S ICP-MS PDF 1 MB
Application Note Speciation of Arsenic in Rice Flour Used as a Capsule Void Filler in Dietary Supplements PDF 1 MB
Flyer 5 Tips to Improving Your Sample Digestion PDF 219 KB