Spotlight™ IR microscope systems are designed to meet the challenges of an expanding laboratory by generating high-quality, reproducible data from a variety of sample types. The Spotlight encompasses intelligent technology and simplicity in operation to take on today’s challenges and those to come.
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The Spotlight 200i FT-IR Microscopy System is designed with state-of-the-art technology to allow for intelligent automation and sophisticated analysis capabilities. The system utilizes a high performance single-point detector to deliver the best sensitivity, while white light LED illumination provides superior visible images. In addition, the Spotlight 200i also has the capability to be fully upgraded to the Spotlight 400 Imaging System.
Unique features of the Spotlight 200i System include:
FT-IR Microscopy for Every Challenge
The Spotlight 200i FT-IR Microscopy System can be configured to meet your FT-IR microscopy demands and produce high-quality spectra from extremely small samples. See the Configurations table below for the standard options.
A variety of optional accessories and consumables are available for use with the Spotlight systems, such as an infrared polarizer kit, heated stage accessory, crystal compression cells, and a micro-sampling tool kit for ease with sample handling and preparation.
Microscopy for a Variety of Applications
Easy to use, yet exceptionally powerful and versatile, the Spotlight’s flexibility and sensitivity make it a perfect addition to any lab setting, in any discipline. Some of the applications supported by the Spotlight 200i System include:
Results Matter
The Spectrum 10 software suite drives the Spotlight 200i system and can support advanced FT-IR analysis in research and industrial laboratories, always providing optimal results. The software supplied with the system gives you full control over the microscope including the focusing on the sample, illumination, stage position, changing between sampling modes, and manipulating the spectra that you collect. The spectrometers can operate in ratio, single-beam, or interferogram mode. SpectrumIMAGE software enables control over the imaging system with the ability to view sample images with ease in real time. With Spectrum MultiSearch, identification of unknown mixtures is made simple through the use of comparison algorithms allowing for the separation and library matching of up to 10 components.
For regulated industries that demand secure IR quality testing, Spectrum 10 ES™ software is available and encompasses user access control, audit trailing, data security, and data integrity to ensure secure analyses to meet the technical demands of 21 CFR Part 11 compliance.
| 21 CFR Part 11 Compatible | Yes |
|---|---|
| Depth | 57.0 cm |
| Detector Type | MCT |
| Height | 47.0 cm |
| Model Name | Spotlight 200i with Spectrum Two System |
| Operating Range | 5 – 40 °C |
| Portable | No |
| Product Brand Name | Spotlight |
| Product Group | Instrument |
| Wave Length Range | 7,800 – 600 cm-1 |
| Weight | 32.0 kg |
| Width | 34.0 cm |
| Model | Spotlight Detector | Spectrum Two System | Includes PC with Stage Controller? | Includes AutoATR Objective? | Part Number | Optional Extras |
|---|---|---|---|---|---|---|
| Spotlight 200i – Spectrum Two Standard | MCT | Standard LiTaO3 detector | No | No | L1862103 |
|
| Spotlight 200i – Spectrum Two Standard | DTGS | Standard LiTaO3 detector | No | No | L1862104 | |
| Spotlight 200i – Spectrum Two System | MCT | Temperature-stabilized DTGS detector, APV/AVI | Yes | No | L1862105 | |
| Spotlight 200i – Spectrum Two with AutoATR | MCT | Temperature-stabilized DTGS detector, APV/AVI | Yes | Yes | L1862106 |
Human hair is typically 50-100 µ in diameter, previous transmission and ATR studies of its cross section1,2 reveal three major identifiable regions.
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This brochure describes the Spotlight 150i and Spotligh 200i FT-IR Microscope System technology.
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Product Certificate for the SPOTLIGHT 150 and 200
ATR FT-IR imaging offers users easy spectroscopic access to “difficult” samples which are hard to image in transmission or reflection, or which have confusing depth structure.
