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UATR Polarization Accessory for Spectrum One (1 Reflection)

The UATR Polarization Accessory is designed to provide reproducible, high quality ATR spectra of materials that polarize light through the use of a variable-angle polarizer mount.

Part Number L1250064
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Attenuated total reflectance (ATR) techniques offer a convenient alternative to thin-film, KBr pellet or diffuse reflectance measurements. The Universal ATR Accessory offers straightforward analysis of most sample types with a minimum of sample preparation. The polarization measurements additionally offered by the UATR Polarization Accessory give additional information on the molecular structure of a sample, particularly the crystal or molecular orientation.

With the UATR Polarization Accessory, the user is able to:

  • Analyze a variety of samples with minimal sample preparation
  • Utilize the live spectral preview mode and force readout in Spectrum software to ensure good, reproducible contact with the crystal
  • Collect spectra of materials with a variable-angle polarizer by selecting the desired angle

The UATR Polarization Accessory is designed for:

  • Crystal structure analysis
  • Polymer and fiber orientation studies
  • Structural studies of biomolecules such as proteins

Features of the UATR Polarization Accessory include:

  • Automatic recognition - as soon as the accessory is placed in the sample compartment the Universal ATR Polarization module is recognized along with its unique number, and system suitability checks can be carried out.
  • Zero alignment, zero set-up - once locked into the instrument, the system is ready to be used without any alignment necessary.
  • Integration - the plug-in module design means the accessory becomes an integral part of the instrument once installed.


Material Diamond/ZnSe (1 Reflection)
Model Compatible With Spectrum 65, Spectrum 400, Spectrum One, Spectrum 100
Product Group UATR Polarization Accessory
Technology Type ATR
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Product Note

Universal ATR Polarization Accessory for Spectrum Series FT-IR Spectrometers

Attenuated total reflectance (ATR) techniques have been well established in FT-IR spectroscopy for many years. They offer a convenient alternative to th

PDF 114 KB

Technical Note

Orientation Effects in ATR Spectra

In an ATR measurement IR radiation that is totally reflected produces an evanescent electric field beyond the surface of the crystal. The evanescent field has components in all directions but it is not uniform, with the result that ATR,spectra are sensitive to any anisotropy in the sample. Because of this relative band intensities may vary, depending on how the sample is presented. This has been exploited to measure the degree of orientation in surface films and,polymers. However it may also lead to unexpected changes when the possibility of anisotropy has not been considered.

PDF 433 KB
The Effects of Varying Force and Contact on ATR Spectra

In recent years ATR has become the preferred method for many routine IR measurements. The ,introduction of sampling accessories with small crystals greatly reduced the contact problem that ,had previously restricted the technique to liquids and soft solids while the hardness and chemical ,resistance of diamond has made ATR an almost universal sampling method. However solid samples ,require pressure to bring them into good contact with the ATR crystal. Increasing this pressure ,changes the relative intensities of bands at different wavelengths and may also induce structural ,changes. This note explains and illustrates the effects that occur.

PDF 536 KB