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Application Note

Using MSF to Resolve Difficult Interferences in Metallurgical Samples with the Avio 500 ICP-OES

Introduction

The analysis of trace metals in metallurgical matrices also presents a challenge for ICP-OES: spectral interferences. Many elements have a large number of emission lines (i.e. approximately 20,000 for iron), which increases the potential for spectral interferences. This effect is compounded in metallurgical samples, where the matrix element(s) are present at high levels due to the minimal dilutions used.