For more than 55 years, PerkinElmer has been an industry leader in UV/Vis/NIR and UV/Vis instrumentation and continues to set benchmarks with the innovative LAMBDA™ Series. Our LAMBDA 850+ UV/Vis spectrophotometer is one of our highest performance UV/Vis system designed for analysis of coatings, high performance glass, and components in both research and manufacturing. The instrument meets industry standards for ultra-high performance, flexibility, and convenience.
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Choose the LAMBDA 850+ for ultra-high UV/Vis performance for wavelengths between 175 nm and 900 nm, for applications such as sun protection, reflectance properties of flat panel display screens, paint films, transmission and reflectance characterization of glass and solar cells.
The LAMBDA 850+ offers unmatched flexibility by providing you the choice to configure systems to suit your needs. From selection of detectors to accessories that provide the most convenient and flexible approach to sampling, the Lambda 850+ is UV/Vis Spectrophotometer is designed for maximum versatility, optimal performance and value:
Unleash the power of your LAMBDA 850+ UV/Vis/NIR spectrophotometer with UV WinLab software designed for operational simplicity and the power to address the most challenging analyses. Our Enhanced Security™ (ES) UV WinLab software is designed for busy pharmaceutical, manufacturing, industrial, food, or academic laboratories in regulated environments that require compliance with US FDA 21 CFR Part 11 regulations.
|21 CFR Part 11 Compatible||Yes|
|Interface||Tungsten-halogen and Deuterium|
|Maximum Temperature||35 °C|
|Minimum Temperature||15 °C|
|Model Name||LAMBDA 850|
|Operating Range||175 - 900 nm|
|Product Brand Name||LAMBDA|
The measurement of very small samples in transmission mode often poses problems. Large-scale losses of energy, scattered light and high backgrounds all impose severe performance requirements on UV/Vis and UV/Vis/NIR instruments. Using small beam apertures can lead to high background absorbance levels, often well over 2A.
The accurate measurement ofspecular reflectance over a substantialrange of angles and a widerange of wavelengths from theUV through NIR is a prerequisite to the design and manufacture ofa wide variety of modern opticalcomponents. In designing a systemDesign Considerations for a VariableAngle Absolute Reflectance AccessoryFor the LAMBDA 950/850/650 UV/Vis/NIRand UV/Vis Spectrophotometers.
We developed spectrophotometry accessories for measuring absolute reflection on highly reflecting samples, not only at near-normal incidences but also at oblique incidences for incident angles up to more than 80 degrees. The accessories are designed for use with a high performance UV/Vis/NIR industrial spectrophotometer and are widely used for the accurate characterisation of mirrors.
In materials research there is sometimes a need to scan high absorbance samples such as laser protection lenses, optical filters, and polarization materials. Such sample types often need to be measured across the whole UV, Vis and NIR ranges of the electromagnetic spectrum.
An optical coating consists of a combination of thin film layers that create interference effects used to enhance transmission or reflection properties for an optical system. How well an optical coating performs is dependent upon the number of factors, including the number of layers, the thickness of each layer and the differences in refractive index at the layer interfaces. The transmission properties of light are predicted by wave theory. One outcome of the wave properties of light is that waves exhibit interference effects. Light waves that are in phase with each other undergo constructive interference, and their amplitudes are additive. Light waves exactly out of phase with each other (by 180°) undergo destructive interference, and their amplitudes cancel. It is through the principle of optical interference that thin film coatings control the reflection and transmission of light.
Today’s plastics are some of the most used materials on a global volume basis. Broadly integrated into today’s industrial and commercial lifestyles, they make a major, irreplaceable contribution to virtually every product category.
In this compendium you will find a wide range of applications for polymers, plastics, rubbers and advanced materials. Discover how to put these applications to work for you simply and efficiently.
The primary goal of this technical note is to guide the user through the accessory selection process for different specular/ diffuse samples. This will be achieved by measuring identical samples with varying contributions of diffuse and specular reflection, on three different reflection accessories, and then comparing the spectra generated.
The determination of spectral transmission of plastic pharmaceutical containers was performed using the LAMBDA 1050 UV/Vis/NIR spectrophotometer and UVWinLab software, in accordance with USP <671>.
The LAMBDA™ 650/850/950 family of UV/Vis and UV/Vis/NIR spectrophotometers are purposedesigned to enable a wide range of sample types to be analyzed, no matter the shape or dimensions.
Today's advanced and increasingly diverse Advanced Materials laboratories are facing new challenges on a daily basis - starting from raw materials right up to the finished product. PerkinElmer's comprehensive portfolio of analytical solutions is designed to give you the higher accuracy, sensitivity, and ease of use your laboratory demands for examining with confidence, the purity, composition, and performance of your compounds. What's more, a range of complementary services is available to keep your laboratory up and running, meeting the stringent requirements of a variety of environments and working practices.
Sunscreen protects skin by either absorbing or reflecting the harmful ultraviolet rays, preventing them from reaching the skin. Using sunscreen while exposed to the sun can greatly reduce the chances of damaging skin cells, and developing cancer. For this study the PerkinElmer® Lambda™ 1050 equipped with a 150 mm integrating sphere will be use to collect scatter transmission data for sunscreen placed on a tape substrate. Testing sunscreen on a tape model of human skin to calculate the SPF value is more convenient and economical than testing on human skin.
Advanced optical materials, nanomaterials, and manmade chemicals can go a long way toward addressing the most vexing issues of our day. In materials testing, there’s sometimes a need to characterize complex samples, such as laser protection lenses, architectural glasses, optical filters, and anti-reflective coatings. Whether you’re performing testing and analysis in specialty glass/glazing, virtual reality, optoelectronics, automotive, laser technology, or solar panels, we have the right solution for you with our high performance LAMBDA™ series and appropriate sampling accessories.
The Polymer Market consists of a huge diversity of manufacturers of industrial products running many different processes yet still facing similar challenges. There is more and more pressure to achieve high product quality and reduce costs in order to stay one step ahead of the competition.
This note demonstrates the use of Hellma® linearity filters to study the linearity of the PerkinElmer® high performance LAMBDA™ instruments (LAMBDA 850, 950 and 1050) in the visible region of the spectrum.
Many cosmetic products now incorporate sunblock components to protect the skin from harmful ultra violet radiation. These products can be identified by the SPF value quoted on the label. A large proportion of these blocking components are nanoparticles that protect the skin, not by absorbing the harmful radiation, but by scattering it away from the skin. The most commonly used are nanoparticles of zinc oxide and titanium dioxide. This paper will discuss a new method for characterization and quantitation of nanoparticles in sunscreens and cosmetics via the use of UV/Visible spectroscopy. The method utilizes a 150 mm integrating sphere equipped with center mount and is able to quantitate and compare the contributions of absorbance, large particle scattering, and nanoparticle scattering.