Semiconductor Resources – NexION 2000

Analysis of SiO2 Nanoparticles in Reaction Mode with Single Particle ICP-MS

With the increased use of nanoparticles (NPs) in various products and processes, the need to characterize them has also increased. Single Particle ICP-MS (SP-ICP-MS) was developed for rapid analysis of nanoparticles, measuring thousands of particles in less than a minute, while providing individual particle information on particle size, particle size distribution, particle concentration, dissolved concentration of the element, and agglomeration.

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