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  • White Paper

    Weighing the Benefits and Risks of Nanotechnology White Paper

    There is a growing body of evidence showing that there are significant differences between some nanomaterials and their non-nanoscale counterparts. What those differences portend raises many new questions about their potential to cause harm to human health and the environment.

  • White Paper

    Single Particle Inductively Coupled Plasma Mass Spectrometry: Understanding How and Why

    Analyzing single nanoparticles with ICP-MS requires a different approach than measuring dissolved elements. This work describes the theory behind single-particle ICP-MS measurements, drawing comparisons and differences with analyzing dissolved elements.

  • Application Note

    Testing and Validation of Various Antacids for Elemental Impurities using the NexION 2000 ICP-MS

    The United States Pharmacopeia (USP) has announced that its new standards for elemental impurities in drug products will be implemented on January 1, 2018. General Chapters <232> and <2232> specify the list of elements and their permissible daily exposure (PDE) limits based on the route of administration.

  • Application Note

    Analysis of Soils and Waters in Accordance with U.S. EPA Method 6020B using the NexION 2000 ICP-MS

    Through the years, both industry and analytical instrumentation have advanced. With the development of new chemicals and processes, new pollutants may enter the environment. However, the capabilities of analytical instruments have also increased, allowing the measurement of ever lower levels of environmental contaminants, as well as new pollutants.

  • Application Note

    Accurate Sizing and Precise Counting of 10 nm Gold Nanoparticles using the NexION 2000 ICP-MS

    In this work, we demonstrate that PerkinElmer's NexION® 2000 ICP-MS, with its unique RF generator and ion optics, coupled with the Syngistix™ Nano Application Software Module, can be used to accurately measure and characterize NP sizes of 10 nm and smaller, both alone and in a mixture of NPs of various sizes.

  • Application Note

    Microwave Digestion - EPA Method 3052 on the Multiwave 3000

    Microwave sample preparation provides an efficient and clean sample preparation for multi-element analytical techniques such as ICP-OES and ICP-MS. As Microwave assisted digestion has evolved, so have the methodologies. EPA method 3052 is designed for the “total” analysis in a variety of matrices including soil, sediments, sludge, oils, biological and botanical materials. This method is the most versatile and has been well proven. It allows variations in reagents and methodology, making it ideal for a variety of matrices and elements. The variability of this method also requires a basic understanding of digestion chemistry.

  • Application Note

    Transport of Nanoparticles From Coated Surfaces Through Physical Contact

    This work investigated the transfer of Ag and CuO nanoparticles from consumer products via simulated dermal contact by using textile wipes as a surrogate using PerkinElmer’s NexION ICP-MS single particle analyzer with the unique Syngistix Nano Application software module for data collection and analysis

  • Application Note

    New Research Evaluating Cisplatin Uptake in Ovarian Cancer Cells by Single Cell ICP-MS

    Cisplatin, carboplatin, and oxaliplatin are the most widely used of platinum-based cancer chemotherapy drugs in the Western world. Cisplatin's effectiveness is due to its ability to bind to the DNA, resulting in DNA-platinum (Pt) adducts, which bend the DNA. The cells must then repair the DNA damage, otherwise DNA replication is blocked resulting in cell death. Many cancers are initially sensitive to platinum-based treatment, but patients frequently relapse with tumors displaying resistance to further cisplatin therapy.

  • Application Note

    The Determination of Lead in Calcium-Based Antacid and Dietary Supplements Using the NexION 350 ICP-MS System to Comply with the State of California's Proposition 65 Legislation

    Compliance with California’s Proposition 65 for the monitoring of lead (Pb) in calcium-based antacid medications and dietary supplements requires the analytical methodology to demonstrate detection limits below 0.05 µg/g in the solid material. The analytical capabilities of Inductively Coupled Plasma Mass Spectrometry (ICP-MS) make it the most suitable technique for performing lead determinations at these low levels on a routine basis.

  • Application Note

    Analysis of Cerium Dioxide Nanoparticles in Soil Using Single Particle ICP-MS

    This work demonstrates a robust method using SP-ICP-MS technology to detect CeO2 NPs which were extracted from soil samples with tetrasodium pyrophosphate (TSPP). Over the past few decades, engineered nanoparticles (ENPs) have been increasingly used in many commercial products. As a result, more and more ENPs have been released into the environment, which raises concerns over their fate, toxicity and transport therein.

  • Application Note

    Analysis of Drinking and Natural Waters using the NexION 2000 ICP-MS

    This work has demonstrated the ability of the NexION 2000 ICP-MS to analyze both natural and drinking water samples in Standard (i.e. non-cell) mode, in accordance with U.S. EPA Method 200.8. Accuracy has been demonstrated through the analysis of several reference materials and spike recoveries, with stability of at least nine hours. Method detection limits allow for trace-level determinations, while the ability to selectively suppress user-defined isotopes also allows the measurement of analyte levels usually only possible by ICP-OES or Flame AA. The NexION 2000 provides a comprehensive solution to the challenge of U.S. EPA Method 200.8 and other drinking and natural water analytical requirements across the globe.

  • Application Note

    Ultratrace Interference-Free Analysis of Solar-Grade Silicon Wafers by ELAN DRC II ICP-MS

    A new, simple sample-preparation method which results in minimal contamination has been developed for the ultratrace interference-free analysis of solar-grade silicon wafers using an ELAN DRC II ICP-MS.

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