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High Sensitivity SilQ Cyclonic Spray Chamber for NexION 1000/2000

This SilQ Baffled Cyclonic C3 High Sensitivity Spray Chamber is used with NexION® 1000 and 2000 ICP-MS series instruments. It is recommended for use in the NexION® 2000 Semiconductor Configuration and is an ideal all-purpose spray chamber for non-HF samples.

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The spray chamber is an integral part of the sample introduction system responsible for filtering the sample mist to permit the appropriate droplet size distribution to reach the plasma. The baffled cyclonic spray chamber features a central transfer tube which acts as a secondary particle separator helping separate larger aerosol particles from the sample. This reduces solvent load in the plasma without compromising detection limits. The distance between the bottom of the baffle and the chamber wall is carefully controlled so that droplets cannot form on the bottom of the baffle. The advantage is smooth draining and improved precision.

This spray chamber is included in the Sample Introduction Kit for NexION 2000 Semi-Conductor Configuration - White (N8150037).


Material SilQ
Model Compatible With NexION 2000, NexION 1000
Product Group Spray Chambers
Type Baffled and Cyclonic