Choose the Frontier™ range of Fourier Transform IR spectrometers for superior spectroscopic performance in demanding applications. Powerful and adaptable, the Frontier meets all your current analysis needs and can be expanded as your research goals evolve. An exceptional signal-to-noise ratio and photometric performance assures optimal spectral quality to ensure best-in-class sensitivity. This configurable platform provides dependable and consistent operation through years of service.
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IR Ready for Any Challenge
The Frontier™ MIR is the industry standard regarding laboratory FT-IR performance. The system can be upgraded to a Spotlight™ microscope system, have an external optical bench added, or be configured with an upgraded or additional detector at any time.
The Frontier MIR is suitable for a wide range of applications and can be configured to your needs regarding the level of performance desired to meet the demand of your daily IR analyses. See the configurations table below for all available instrument options.
Frontier FT-MIR spectrometers feature:
An External Beam Pack can be configured to allow for automatic beam path switching for use with external accessories such as the Spotlight™ microscope, NIRA accessory, and the General Purpose Optical Bench.
Setting the Standard
The Frontier is loaded with a range of advanced innovations designed to provide optimal performance from the configuration you choose.
Ultimate Performance & Unrivalled Flexibility
PerkinElmer recognizes that every application is different. The result is a complete solution to provide the fastest assurance of the quality of your materials, regardless of the application. For these specific applications, we offer various analysis systems and application pack add-ons.
Frontier is designed to function with a variety of sampling accessories to enhance the versatility of the instrument including the Diffuse Reflectance Accessory, HATR, NIRA, TG-IR interface, UATR, Polarized UATR, General-Purpose Optical Bench, and Specular Reflectance Accessory.
The Spectrum 10 software suite drives the Frontier MIR system and can support advanced FT-IR analysis in research and industrial laboratories, always providing optimal results. The software supplied with your instrument enables you to control the instrument and to manipulate the spectra that you collect. The spectrometers can operate in ratio, single-beam, or interferogram mode.
For regulated industries that demand secure IR quality testing, Spectrum 10 ES™ software is available and encompasses user access control, audit trailing, data security, and data integrity to ensure secure analyses to meet the technical demands of 21 CFR Part 11 compliance. The revolutionary Spectrum AssureID™ software is available and can provide manufacturing QA/QC functions with a rapid, unambiguous means of verifying identity and quality of a production material. Spectrum Quant is an optional software package designed for novice and advanced spectroscopists who need to integrate accurate quantitative analysis into their MIR analysis.
|21 CFR Part 11 Compatible||Yes|
|Model Name||Frontier FT-IR|
|Operating Range||5 - 40 °C|
|Product Brand Name||Frontier|
|Technology Type||Infrared (IR)|
|Wave Length Range||8,300 – 350 cm-1|
|Detector Type||Beamsplitter||Optics||External Beam Pack?||Software||Part Number|
|LiTaO3||KBr||Aluminum||No||Spectrum 10 ES||L1280003|
|LiTaO3||KBr||Aluminum||Yes||Spectrum 10 ES||L1280007|
|LiTaO3||KBr||Gold||No||Spectrum 10 ES||L1280005|
|LiTaO3||KBr||Gold||Yes||SSpectrum 10 ES||L1280009|
|DTGS||KBr||Aluminum||No||Spectrum 10 ES||L1280011|
|DTGS||KBr||Aluminum||Yes||Spectrum 10 ES||L1280013|
|DTGS||KBr||Gold||No||Spectrum 10 ES||L1280015|
|DTGS||KBr||Gold||Yes||Spectrum 10 ES||L1280017|
|DTGS||CsI||Aluminum||No||Spectrum 10 ES||L1280019|
|DTGS||CsI||Aluminum||Yes||Spectrum 10 ES||L1280023|
|DTGS||CsI||Gold||No||Spectrum 10 ES||L1280021|
|DTGS||CsI||Gold||Yes||Spectrum 10 ES||L1280025|
You have selected:
|Resource Type||File Name||File Format|
|Brochure||PerkinElmer Frontier FT-IR, NIR and FIR Spectroscopy Brochure||PDF 12 MB|
|Brochure||PerkinElmer Frontier and Spectrum Two FT-IR, NIR and FIR Spectroscopy Brochure||PDF 2 MB|
|Brochure||Spotlight 150i 200i FT-IR Microscope Systems Brochure||PDF 1 MB|
|Brochure||Spotlight 400 FT-IR Brochure||PDF 1 MB|
|Brochure||Spotlight™ 400 FT-IR and 400N FT-NIR Imaging Systems Brochure||PDF 1 MB|
|Product Note||Spectrum Touch Software Product Note||PDF 1 MB|
|Product Note||TIBCO Spotfire Software for IR Instrumentation Product Note||PDF 730 KB|
|Guide||Hyphenated Technology Guide||PDF 3 MB|
|Guide||Material Characterization Instrument Guide||PDF 6 MB|
|White Paper||Growing Concerns Over Microplastics in Water White Paper||PDF 627 KB|
|Application Note||Advanced Data Analysis of Evolved Gases from TG-IR Hyphenation Studies of Polymers||PDF 2 MB|
|Application Note||Detection and Identification of Microplastic Particles in Cosmetic Formulations Using IR Microscopy||PDF 287 KB|
|Application Note||Plasticizer Characterization by TG-IR||PDF 1022 KB|
|Application Note||Rapid Characterization of Multiple Regions of Interest in a Sample Using Automated IR Microscopy||PDF 241 KB|
|Poster||Advanced Solutions for Polymers And Plastics Poster||PDF 2 MB|
|Poster||Microplastics and their Alternatives for Intentional Use in Products Poster||PDF 1 MB|
|Poster||The Application of Infrared Microscopy for the Analysis of Microplastics in Water-Borne||PDF 457 KB|
|Product Info||Polymer Applications Compendium||PDF 11 MB|
|Article||Identification and Quantification of Microplastics in Wastewater Using Focal Plane||PDF 3 MB|
|Article||Water Pollution by Microscopic Plastic Particles Article||PDF 613 KB|